Implementation of Memory Built-In Self-Test

The objective of this project is to design and implement a Memory Built-In Self-Test (MBIST) architecture for efficient testing and fault detection in embedded memory systems. It focuses on developing a self-test mechanism that can identify common memory faults such as stuck-at, transition, and coupling faults without external testing equipment. The design will be simulated and verified to ensure high fault coverage, low area overhead, and reliable performance. Different test algorithms will be analyzed to optimize testing time and accuracy. The overall goal is to create a cost-effective and efficient MBIST solution suitable for modern VLSI and SoC applications.