Study on Early Capture Based VLSI Aging Monitoring Techniques

VLSI circuits in automotive fields deal with excessive heat and workload that is why aging of semiconductor devices become rapid that reduces the reliability and life span of the corresponding system. Aging monitoring of such circuits helps avoiding result in catastrophes. This paper presents study of early capture based aging monitoring techniques those use extra scan chains to monitor the aging during normal operation when the circuit is in functional mode. The architecture and operation are discussed for the two early capture based aging monitoring techniques; moreover, comparison between both approaches is also given.