Improving Error Correction Code for Multiple Cell Upsets in Space Applications

Also Available Domains Communications|Xilinx Vivado

Project Code :TVMATO25

Objective

The main objective of this project is to implement a series of new low redundant Error Correction Codes able to correct Multiple-Cell Upsets with reduced area, power, and delay overheads.

Abstract

Currently, faults suffered by SRAM memory systems have increased due to the aggressive CMOS integration density. Thus, the probability of occurrence of single-cell upsets (SCUs) or multiple-cell upsets (MCUs) augments. One of the main causes of MCUs in space applications is cosmic radiation. A common solution is the use of error correction codes (ECCs). 

Nevertheless, when using ECCs in space applications, they must achieve a good balance between error coverage and redundancy, and their encoding/decoding circuits must be efficient in terms of area, power, and delay. Different codes have been proposed to tolerate MCUs. For instance, Matrix codes use Hamming codes and parity checks in a bi-dimensional layout to correct and detect some patterns of MCUs. 

Recently presented, column–line–code (CLC) has been designed to tolerate MCUs in space applications. CLC is a modified Matrix code, based on extended Hamming codes and parity checks. Nevertheless, a common property of these codes is the high redundancy introduced. In this paper, we present a series of new low redundant ECCs able to correct MCUs with reduced area, power, and delay overheads. Also, these new codes maintain, or even improve, memory error coverage with respect to Matrix and CLC codes.

NOTE: Without the concern of our team, please don't submit to the college. This Abstract varies based on student requirements.

Block Diagram

Specifications

Software Requirements:

  • Xilinx ISE Tool 
  • HDL: Verilog

Hardware Requirements:

  • Microsoft® Windows XP
  • Intel® Pentium® 4 processor or Pentium 4 equivalent with SSE support 
  • 512 MB RAM
  • 100 MB of available disk space

Learning Outcomes

  • Basics of Digital Electronics
  • FPGA design Flow
  • Introduction to Verilog Coding
  • Different modeling styles in Verilog
    • Data Flow modeling
    • Structural modeling
    • Behavioral modeling
    • Mixed level modeling
  • Combinational & Sequential circuits
  • Knowledge on Error correction codes
  • Study on Hamming code
  • Knowledge on Matrix, CLC, and both SEC–DAED codes
  • About single cell upsets and multi cell upsets
  • Applications of error correction codes in real time
  • Xilinx ISE 14.7 for design and simulation
  • Generation of Netlist 
  • Solution providing for real time problems
  • Project Development Skills:
    • Problem Analysis Skills
    • Problem Solving Skills
    • Logical Skills
    • Designing Skills
    • Testing Skills
    • Debugging Skills
    • Presentation Skills
    • Thesis Writing Skills


Demo Video