Also Available Domains DSP Core|Xilinx ISE
The main objective of this project is to reduce the area by replacing the multipliers with the use of adders and shifters. This paper is to implement for reducing the number of computations by integrating the computation of the radix-2 Fast Fourier Transform (FFT) with the Distributed Arithmetic (DA) and Complex Binary Number System (CBNS)
In this project, a novel Scan-Based Logic Built-In Self-Test (LBIST) is proposed and it can be used to control the scan-shift power to an arbitrary level. High power consumption in LBIST, is a crucial issue that can cause over-testing, reliability degradation, chip damage.
The proposed method modifies pseudo-random patterns generated by an embedded test pattern generator (TPG) so that the modified patterns have the specific toggle rate without sacrificing fault coverage and test time. The effectiveness of the proposed design is synthesized and simulated using Xilinx Vivado software.
Keywords: Built-In-Self-Test (BIST), Linear Feedback Shift Register (LFSR), Test Pattern Generator, Scan design
NOTE: Without the concern of our team, please don't submit to the college. This Abstract varies based on student requirements.

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