This work introduces an innovative low-power, high-speed dynamic comparator with a new latching step.
When designing high-speed analog-to-digital converters (ADC) and digital I/O circuits, low- This work introduces an innovative low-power, high-speed dynamic comparator with a new latching step. Cross-coupled transistors with distinct gate-biasing are used in the suggested latching stage rather than the usual cross-coupled inverter layout. A considerably quicker comparison with less energy consumption is made possible by the straightforward suggested latching step, which increases its effective total trans conductance at the start of the comparison phase. Through simulations and tests, the comparator's latency and power usage are examined and contrasted with that of its predecessor.
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