A Flexible Scan-in Power Control Method in Logic BIST and Its Evaluation with TEG Chips

Also Available Domains Design for Testability|Xilinx Vivado

Project Code :TVPGTO391

Objective

The main objective of this project is to reduce the high power dissipation in scan-based logic built-in self-test. The proposed method modifies pseudo-random patterns generated by an embedded test pattern generator (TPG)

Abstract

In this project, a novel Scan-Based Logic Built-In Self-Test (LBIST) is proposed and it can be used to control the scan-shift power to an arbitrary level. High power consumption in LBIST, is a crucial issue that can cause over-testing, reliability degradation, chip damage. The proposed method modifies pseudo-random patterns generated by an embedded test pattern generator (TPG) so that the modified patterns have the specific toggle rate without sacrificing fault coverage and test time. The effectiveness of the proposed method is designed using Xilinx ISE 14.7.

Keywords: Built-In-Self-Test (BIST), Linear Feedback Shift Register (LFSR), Test Pattern Generator, Scan design

NOTE: Without the concern of our team, please don't submit to the college. This Abstract varies based on student requirements.

Block Diagram

Specifications

Software Requirements:

Xilinx ISE Tool
HDL: Verilog

Hardware Requirements:

Microsoft® Windows XP
Intel® Pentium® 4 processor or Pentium 4 equivalent with SSE support
512 MB RAM
100 MB of available disk space

Learning Outcomes

Basics of Digital Electronics
FPGA design Flow
Introduction to Verilog Coding
Different modeling styles in Verilog

Data Flow modeling
Structural modeling
Behavioral modeling
Mixed level modeling

Combinational & Sequential circuits
Testing concepts
Stuck-at-zero & stuck-at-one faults
Knowledge on Pseudo-random patterns
Finite State Machines
Fault coverage
Knowledge on scan in power control approaches

Basic control
Swap control
Moving control

Applications in real time.
Xilinx ISE 14.7 for design and simulation.
Generation of Netlist
Solution providing for real time problems.
Project Development Skills:

Problem Analysis Skills
Problem Solving Skills
Logical Skills
Designing Skills
Testing Skills
Debugging Skills
Presentation Skills
Thesis Writing Skills

Demo Video

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Front End Domains

DSP Core
Communications and Crypto Core
Design for Testability
Arithmetic Core
Nano Technology

Back End Domains

Nano Technology
Core Memories
Transistor Logic
Low Power VLSI

Tools

Cadence EDA
Xilinx Vivado
Xilinx ISE
Tanner EDA
FPGA

Others

Matlab Interfacing