Certificate Verification        Student Ambassador          Quick Pay        Request For Enquiry
Sell Your Project      Apply for franchise          
  • 0877-2261612       
  • +91-9030 333 433
  • +91-9966 062 884

Study On Early Capture Based VLSI Aging Monitoring Techniques

STUDY ON EARLY CAPTURE BASED VLSI AGING MONITORING TECHNIQUES

  • Project Code :
  • TVMAFE77
  • .
Download Project Document / Synopsis

STUDY ON EARLY CAPTURE BASED VLSI AGING MONITORING TECHNIQUES

VLSI circuits in automotive fields deal with excessive heat and workload that is why aging of semiconductor devices become rapid that reduces the reliability and life span of the corresponding system. Aging monitoring of such circuits helps avoiding result in catastrophes. This paper presents study of early capture based aging monitoring techniques those use extra scan chains to monitor the aging during normal operation when the circuit is in functional mode. The architecture and operation are discussed for the two early capture based aging monitoring techniques; moreover, comparison between both approaches is also given.

innovative
innovative Request Video

Package Features

  • 24/7 Support
  • Ticketing System
  • Voice Conference
  • Video On Demand
  • Remote Connectivity
  • Code Customization
  • Customization
  • Live Chat Support
  • Toll Free Support

Includes

  • Complete Source Code
  • Complete Documentation
  • Complete Presentation Slides
  • Flow Diagram
  • Screenshots
  • Execution Procedure
  • Readme File
  • Video Tutorials

Leave Your Comment!

Your email address will not be published. Required fields are marked *

Call us : (+91) 9030333433 / 08772261612
Mail us : takeoffstudentprojects@gmail.com
Mail us : info@takeoffprojects.com