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Front End Research Projects
Sl.No Project ID Design for Testability Projects Action
1 TVREFE19_33 On-chip Self-test Methodology With All Deterministic Compressed Test Patterns Recorded In Scan Chains View Details
2 TVREFE19_35 A Low-power Parallel Architecture For Linear Feedback Shift Registers View Details
3 TVREFE19_03 A High Performance Scan Flip-flop Design For Serial And Mixed Mode Scan Test View Details
4 TVREFE19_32 Automatic Test Pattern Generation For Timing Verification And Delay Testing Of Rsfq Circuits View Details
5 TVREFE19_56 FPGA-based True Random Number Generation Using Programmable Delays In Oscillator-rings View Details
6 TVREFE19_57 FPGA-based True Random Number Generation Using Programmable Delays In Oscillator-rings View Details
7 TVREFE19_47 Efficient Design-for-test Approach For Networks-on-chip View Details
8 TVREFE19_57 A Lightweight LFSR-Based Strong Physical Unclonable Function Design on FPGA View Details
9 TVREFE19_51 Modified Dual-CLCG Method And Its VLSI Architecture For Pseudorandom Bit Generation View Details
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